Feature-Sized Sampling for Vector Line Art

dc.contributor.authorOhrhallinger, Stefanen_US
dc.contributor.authorParakkat, Amal Deven_US
dc.contributor.authorMemari, Pooranen_US
dc.contributor.editorChaine, Raphaëlleen_US
dc.contributor.editorDeng, Zhigangen_US
dc.contributor.editorKim, Min H.en_US
dc.date.accessioned2023-10-09T07:42:38Z
dc.date.available2023-10-09T07:42:38Z
dc.date.issued2023
dc.description.abstractBy introducing a first-of-its-kind quantifiable sampling algorithm based on feature size, we present a fresh perspective on the practical aspects of planar curve sampling. Following the footsteps of e-sampling, which was originally proposed in the context of curve reconstruction to offer provable topological guarantees [ABE98] under quantifiable bounds, we propose an arbitrarily precise e-sampling algorithm for sampling smooth planar curves (with a prior bound on the minimum feature size of the curve). This paper not only introduces the first such algorithm which provides user-control and quantifiable precision but also highlights the importance of such a sampling process under two key contexts: 1) To conduct a first study comparing theoretical sampling conditions with practical sampling requirements for reconstruction guarantees that can further be used for analysing the upper bounds of e for various reconstruction algorithms with or without proofs, 2) As a feature-aware sampling of vector line art that can be used for applications such as coloring and meshing.en_US
dc.description.sectionheadersMotion Capture and Generation
dc.description.seriesinformationPacific Graphics Short Papers and Posters
dc.identifier.doi10.2312/pg.20231268
dc.identifier.isbn978-3-03868-234-9
dc.identifier.pages31-38
dc.identifier.pages8 pages
dc.identifier.urihttps://doi.org/10.2312/pg.20231268
dc.identifier.urihttps://diglib.eg.org:443/handle/10.2312/pg20231268
dc.publisherThe Eurographics Associationen_US
dc.rightsAttribution 4.0 International License
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.subjectCCS Concepts: Computing methodologies -> Point-based models; Parametric curve and surface models
dc.subjectComputing methodologies
dc.subjectPoint
dc.subjectbased models
dc.subjectParametric curve and surface models
dc.titleFeature-Sized Sampling for Vector Line Arten_US
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