Faster Ray Tracing through Hierarchy Cut Code

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dc.contributor.authorXiang, WeiLaien_US
dc.contributor.authorLiu, FengQien_US
dc.contributor.authorTan, Zaonanen_US
dc.contributor.authorLi, Danen_US
dc.contributor.authorXu, PengZhanen_US
dc.contributor.authorLiu, MeiZhien_US
dc.contributor.authorKou, QiLongen_US
dc.contributor.editorChen, Renjieen_US
dc.contributor.editorRitschel, Tobiasen_US
dc.contributor.editorWhiting, Emilyen_US
dc.date.accessioned2024-10-13T18:08:22Z
dc.date.available2024-10-13T18:08:22Z
dc.date.issued2024
dc.description.abstractWe propose a novel ray reordering technique designed to accelerate the ray tracing process by encoding and sorting rays prior to traversal. Our method, called ''hierarchy cut code'', involves encoding rays based on the cuts of the hierarchical acceleration structure, rather than relying solely on spatial coordinates. This approach allows for a more effective adaptation to the acceleration structure, resulting in a more reliable and efficient encoding outcome. Furthermore, our research identifies ''bounding drift'' as a major obstacle in achieving better acceleration effects using longer sorting keys in existing reordering methods. Fortunately, our hierarchy cut code successfully overcomes this issue, providing improved performance in ray tracing. Experimental results demonstrate the effectiveness of our approach, showing up to a 1.81 times faster secondary ray tracing compared to existing methods. These promising results highlight the potential for further enhancement in the acceleration effect of reordering techniques, warranting further exploration and research in this exciting field.en_US
dc.description.number7
dc.description.sectionheadersRendering and Lighting I
dc.description.seriesinformationComputer Graphics Forum
dc.description.volume43
dc.identifier.doi10.1111/cgf.15226
dc.identifier.issn1467-8659
dc.identifier.pages12 pages
dc.identifier.urihttps://doi.org/10.1111/cgf.15226
dc.identifier.urihttps://diglib.eg.org/handle/10.1111/cgf15226
dc.publisherThe Eurographics Association and John Wiley & Sons Ltd.en_US
dc.subjectCCS Concepts: Computing methodologies → Ray tracing
dc.subjectComputing methodologies → Ray tracing
dc.titleFaster Ray Tracing through Hierarchy Cut Codeen_US
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