Level of Detail Visual Analysis of Structures in Solid-State Materials
dc.contributor.author | Thygesen, Signe Sidwall | en_US |
dc.contributor.author | Abrikosov, Alexei I. | en_US |
dc.contributor.author | Steneteg, Peter | en_US |
dc.contributor.author | Masood, Talha Bin | en_US |
dc.contributor.author | Hotz, Ingrid | en_US |
dc.contributor.editor | Hoellt, Thomas | en_US |
dc.contributor.editor | Aigner, Wolfgang | en_US |
dc.contributor.editor | Wang, Bei | en_US |
dc.date.accessioned | 2023-06-10T06:34:35Z | |
dc.date.available | 2023-06-10T06:34:35Z | |
dc.date.issued | 2023 | |
dc.description.abstract | We propose a visual analysis method for the comparison and evaluation of structures in solid-state materials based on the electron density field using topological analysis. The work has been motivated by a material science application, specifically looking for new so-called layered materials whose physical properties are required in many modern technological developments. Due to the incredibly large search space, this is a slow and tedious process, requiring efficient data analysis to characterize and understand the material properties. The core of our proposed analysis pipeline is an abstract bar representation that serves as a concise signature of the material, supporting direct comparison and also an exploration of different material candidates. | en_US |
dc.description.sectionheaders | 3D | |
dc.description.seriesinformation | EuroVis 2023 - Short Papers | |
dc.identifier.doi | 10.2312/evs.20231043 | |
dc.identifier.isbn | 978-3-03868-219-6 | |
dc.identifier.pages | 55-59 | |
dc.identifier.pages | 5 pages | |
dc.identifier.uri | https://doi.org/10.2312/evs.20231043 | |
dc.identifier.uri | https://diglib.eg.org:443/handle/10.2312/evs20231043 | |
dc.publisher | The Eurographics Association | en_US |
dc.rights | Attribution 4.0 International License | |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | |
dc.title | Level of Detail Visual Analysis of Structures in Solid-State Materials | en_US |
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